Browsing by Subject JLT
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| Upload Date | Award Date | Title | Researcher | Guide(s) |
|---|---|---|---|---|
| 29-Oct-2024 | 2024 | Exploring the Reliability of LDMOS and Junctionless FETs in Harsh Environments: High-Temperature and High-Radiation Applications | Routh, Sujay | Baruah, Ratul Kumar |