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Please use this identifier to cite or link to this item: http://192.168.98.239:8080/jspui/handle/1994/1774
Title: Exploring the Reliability of LDMOS and Junctionless FETs in Harsh Environments: High-Temperature and High-Radiation Applications
Researcher: Routh, Sujay
Guides: Baruah, Ratul Kumar
Keywords: DG-SiCJLT;FET;High-temperature;JLT;JL-TFET;LDMOS;P+-SiCJLT
Award Date: 2024
Department: Department of Electronics and Communication Engineering
Publisher: Tezpur University
Upload Date: 29-Oct-2024
Abstract: Available.
Pagination: xxiv, 142 p.
URI: http://192.168.98.239:8080/jspui/handle/1994/1774
Appears in Collections:Theses

Files in This Item:
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01_title.pdf156.93 kBAdobe PDFView/Open
02_prelim pages.pdf1.8 MBAdobe PDFView/Open
03_content.pdf654.02 kBAdobe PDFView/Open
04_abstract.pdf420.86 kBAdobe PDFView/Open
05_chapter 1.pdf1.36 MBAdobe PDFView/Open
06_chapter 2.pdf1.75 MBAdobe PDFView/Open
07_chapter 3.pdf1.96 MBAdobe PDFView/Open
08_chapter 4.pdf2.4 MBAdobe PDFView/Open
09_chapter 5.pdf743.92 kBAdobe PDFView/Open
10_annexure.pdf54.8 kBAdobe PDFView/Open
80_Recommendation.pdf788.42 kBAdobe PDFView/Open
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