Please use this identifier to cite or link to this item:
http://192.168.98.239:8080/jspui/handle/1994/758| Title: | Impedance spectroscopy: an efficient technique to characterize silicon wafers and solar cells |
| Researcher: | Das, Rupali |
| Guides: | Deka, Dhanapati |
| Keywords: | Energy Technology;Impedance spectroscopy |
| Award Date: | Jun-2013 |
| Publisher: | Tezpur University |
| Upload Date: | 29-Jan-2018 |
| Abstract: | Available |
| Pagination: | 71p. |
| URI: | http://192.168.98.42:8080/jspui/handle/1994/758 |
| Appears in Collections: | Dissertations |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 01_title_1505.pdf | Title | 20.95 kB | Adobe PDF |  View/Open |
| 02_abstract_1505.pdf | Abstract | 46.19 kB | Adobe PDF |  View/Open |
| 03_cert_decn_ack_1505.pdf | Certificate, Declaration and Acknowledgement | 554.43 kB | Adobe PDF |  View/Open |
| 04_cont_fig_tab_1505.pdf | List of Contents, Tables, Figures and Abbreviations | 199.02 kB | Adobe PDF |  View/Open |
| 05_main chapters_1505.pdf Restricted Access | Main Chapters and References | 4.81 MB | Adobe PDF | View/Open Request a copy |
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