Please use this identifier to cite or link to this item:
http://192.168.98.239:8080/jspui/handle/1994/758Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.date.accessioned | 2018-01-29T05:38:33Z | - |
| dc.date.available | 2018-01-29T05:38:33Z | - |
| dc.date.issued | 2013-06 | - |
| dc.identifier.uri | http://192.168.98.42:8080/jspui/handle/1994/758 | - |
| dc.description.abstract | Available | en_US |
| dc.format.extent | 71p. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Tezpur University | en_US |
| dc.subject | Energy Technology | en_US |
| dc.subject | Impedance spectroscopy | en_US |
| dc.title | Impedance spectroscopy: an efficient technique to characterize silicon wafers and solar cells | en_US |
| dc.type | Technical Report | en_US |
| dc.contributor.guide | Deka, Dhanapati | - |
| dc.creator.researcher | Das, Rupali | - |
| Appears in Collections: | Dissertations | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 01_title_1505.pdf | Title | 20.95 kB | Adobe PDF |  View/Open |
| 02_abstract_1505.pdf | Abstract | 46.19 kB | Adobe PDF |  View/Open |
| 03_cert_decn_ack_1505.pdf | Certificate, Declaration and Acknowledgement | 554.43 kB | Adobe PDF |  View/Open |
| 04_cont_fig_tab_1505.pdf | List of Contents, Tables, Figures and Abbreviations | 199.02 kB | Adobe PDF |  View/Open |
| 05_main chapters_1505.pdf Restricted Access | Main Chapters and References | 4.81 MB | Adobe PDF | View/Open Request a copy |
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