Semiconductor Memories Technology,Testing and Reliability / Sharma,Ashok K.

By: Sharma,Ashok KMaterial type: Text

TextLanguage: English Publication details: New york: IEEE, 1996. Edition: 1st edDescription: xi,451p;23cmISBN: 0780311140DDC classification: 621.39732 SHA

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Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode	Item holds
Textbooks	Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book)	Central Library, TU	621.39732 SHA (Browse shelf(Opens below))	1	Available		21979

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