Random testing of Digital Circuits / David,Rane.

By: David,RaneMaterial type: Text

TextLanguage: English Publication details: New york: Marcel Dakker, 1998. Edition: 1st edDescription: xvii,463p;23cmISBN: 0824701828DDC classification: 621.3815 DAV

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode	Item holds
Textbooks	Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book)	Central Library, TU	621.3815 DAV (Browse shelf(Opens below))	1	Available		21996

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