Transmission electron microscopy and diffractometry of materials / B. Fultz and J.M. Howe.

By: B., FultzContributor(s): J.M. HoweMaterial type: Text

TextLanguage: English Publication details: Berlin: Springer verlag, 2001. Description: 748p;25cmISBN: 3540678417DDC classification: 620..1299 FUL

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode	Item holds
Gifted Books	Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book)	Central Library, TU	620..1299 FUL (Browse shelf(Opens below))	1	Available		G440

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