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Scanning electron microscopy and x-ray microanalysis / Joseph Goldstein... [et al.].

By: Goldstein, Joseph Contributor(s): Newbury, Dale | Joy, David | Lyman, Charles | Echlin, Patrick | Lifshin, Eric | Sawyer, Linda | Michael, Joseph Material type: Text

Text

TextLanguage: English Publication details: New York : Elsevier, ©2003. Edition: 3rd edDescription: xix, 690 p. : ill ; 25 cmISBN: 9781461349693Subject(s): Scanning electron microscopy | X-ray microanalysis | Microscopy | Nanotechnology | Physics | Surfaces (Physics) | Materials science | Physical measurements | Spectrum analysisDDC classification: 502.825

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Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode	Item holds
Textbooks	Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book)	Central Library, TU	502.825 GOL (Browse shelf(Opens below))	1	Available		90787

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Previous	502.82 MON Fundamentals of fluorescence microscopy :	502.82 MUR Fundamentals of light microscopy and electronic imaging /	502.825 CHA Electron diffraction in the transmission electron microscope /	502.825 GOL Scanning electron microscopy and x-ray microanalysis /	502.825 HOR Fundamentals of high-resolution transmission electron microscopy /	502.825 LAW Scanning electron microscopy and X-ray microanalysis /	502.825 REI Energy-filtering transmission electron microscopy /	Next

Includes bibliographical references and index.

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