Linear and nonlinear models for the analysis of repeated measurments / Vonesh,Edward F.

By: Vonesh,Edward FMaterial type: Text

TextLanguage: English Publication details: New York: Mercel Dekker, 1997. Description: xii,560p;25cmISBN: 0824782488DDC classification: 519.535 VON

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode	Item holds
Textbooks	Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book)	Central Library, TU	519.535 VON (Browse shelf(Opens below))	1	Available		10137

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