Sharma,Ashok K. <br/><br/>
Semiconductor Memories Technology,Testing and Reliability / 
Sharma,Ashok K. 
 - 1st ed 
 - New york:  IEEE,  1996. 
 - xi,451p;23cm 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>0780311140 
<br/><br/><label>Dewey Class. No.: </label>621.39732 SHA