David,Rane <br/><br/>
Random testing of Digital Circuits / 
David,Rane. 
 - 1st ed 
 - New york:  Marcel Dakker,  1998. 
 - xvii,463p;23cm 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>0824701828 
<br/><br/><label>Dewey Class. No.: </label>621.3815 DAV