Ernset,F <br/><br/>
High-resolution imaging and spectrometry of materials / 
Ernset,F. 
 - New York:  Springer,  2003. 
 - xiv,440p;26cm 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>3540418180 
<br/><br/><label>Dewey Class. No.: </label>621.11 HIG