TY  - BOOK
AU  - Millman,Jacob
TI  - Microelectronics
SN  - 007100596X
U1  - 621.3817  
PY  - 1987///
CY  - New York
PB  - McGraw-Hill
KW  - Microelectronics
KW  - Materials
KW  - Testing
N1  - Includes bibliographical references
ER  -