Kumar, Javlkar Dinesh <br/><br/>
VLSI test principles and architecture / 
Javlkar Dinesh Kumar 
 - Delhi :  A. Kumar & Sons,  2019. 
 - 254 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and indexes. 
<br/><br/><label>ISBN: </label>9789385358425 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering.<br/>Integrated circuits --Testing. --Very large scale integration<br/>Integrated circuits--Very large scale integration--Design.
<br/><br/><label>Dewey Class. No.: </label>621.395  / KUM