TY  - BOOK
AU  - Kumar,Javlkar Dinesh
TI  - VLSI test principles and architecture
SN  - 9789385358425
U1  - 621.395 
PY  - 2019///
CY  - Delhi
PB  - A. Kumar & Sons
KW  - Engineering
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing.
KW  - Design
N1  - Includes bibliographical references and indexes
ER  -