Scanning electron microscopy and x-ray microanalysis / Joseph Goldstein... [et al.].
Material type: TextLanguage: English Publication details: New York : Elsevier, ©2003. Edition: 3rd edDescription: xix, 690 p. : ill ; 25 cmISBN: 9781461349693Subject(s): Scanning electron microscopy | X-ray microanalysis | Microscopy | Nanotechnology | Physics | Surfaces (Physics) | Materials science | Physical measurements | Spectrum analysisDDC classification: 502.825Item type | Current library | Home library | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Textbooks | Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book) | Central Library, TU | 502.825 GOL (Browse shelf(Opens below)) | 1 | Available | 90787 |
Total holds: 0
Includes bibliographical references and index.
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