VLSI test principles and architecture / Javlkar Dinesh Kumar
Material type:
TextLanguage: English Publication details: Delhi : A. Kumar & Sons, 2019. Description: 254 p. : ill. ; 24 cmISBN: 9789385358425Subject(s): Engineering | Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- DesignDDC classification: 621.395
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds |
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Textbooks
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Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book) | Central Library, TU | 621.395 KUM (Browse shelf(Opens below)) | Available | 111863 | ||
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Textbooks
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Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book) | Central Library, TU | 621.395 KUM (Browse shelf(Opens below)) | Available | 111864 | ||
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Textbooks
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Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book) | Central Library, TU | 621.395 KUM (Browse shelf(Opens below)) | Available | 111865 | ||
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Textbooks
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Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book) | Central Library, TU | 621.395 KUM (Browse shelf(Opens below)) | Available | 111866 | ||
|
Textbooks
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Central Library, TU Textbook Section (Consult Shelf-Guide to locate the book) | Central Library, TU | 621.395 KUM (Browse shelf(Opens below)) | Available | 111867 |
Total holds: 0
Includes bibliographical references and indexes.
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