| 000 | 00542nam a2200205Ia 4500 | ||
|---|---|---|---|
| 999 |
_c10426 _d10426 |
||
| 001 | 14694 | ||
| 003 | IN-TzU | ||
| 005 | 20210312111353.0 | ||
| 008 | 180118s9999||||xx |||||||||||||| ||eng|| | ||
| 020 | _a3540678417 | ||
| 040 | _aTULIB | ||
| 041 | _aeng | ||
| 082 | _a620.11299 FUL | ||
| 100 |
_aFultz,B. _924600 |
||
| 245 | 0 |
_aTransmission electron microscopy and diffractometry of materials / _cFultz,B. |
|
| 260 |
_aBerlin: _bSpringer, _c2001. |
||
| 300 | _axix,735p;25cm | ||
| 504 | _aIncludes bibliographical references. | ||
| 942 | _cBK | ||