| 000 | 00558nam a2200193Ia 4500 | ||
|---|---|---|---|
| 001 | 21996 | ||
| 008 | 180118s9999||||xx |||||||||||||| ||eng|| | ||
| 020 | _a0824701828 | ||
| 040 |
_aTULIB _cTULIB |
||
| 041 | _aeng | ||
| 082 | _a621.3815 DAV | ||
| 100 | _aDavid,Rane | ||
| 245 | 0 |
_aRandom testing of Digital Circuits / _cDavid,Rane. |
|
| 250 | _a1st ed | ||
| 260 |
_aNew york: _bMarcel Dakker, _c1998. |
||
| 300 | _axvii,463p;23cm | ||
| 504 | _aIncludes bibliographical references. | ||
| 942 | _cBK | ||
| 999 |
_c15133 _d15133 |
||