| 000 | 00770nam a22002417a 4500 | ||
|---|---|---|---|
| 001 | 111863 | ||
| 003 | IN-TzU | ||
| 005 | 20240917124733.0 | ||
| 008 | 240917b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9789385358425 | ||
| 040 | _aIN-TzU | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a621.395 _bKUM |
| 100 | 1 |
_aKumar, Javlkar Dinesh _948551 |
|
| 245 | 1 | 0 |
_aVLSI test principles and architecture / _cJavlkar Dinesh Kumar |
| 260 |
_aDelhi : _bA. Kumar & Sons, _c2019. |
||
| 300 |
_a254 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and indexes. | ||
| 650 | 0 | _aEngineering. | |
| 650 | 0 |
_aIntegrated circuits _vVery large scale integration _xTesting. _948552 |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _vDesign. _948553 |
|
| 942 | _cBK | ||
| 999 |
_c60753 _d60753 |
||