| 000 | 00584nam a2200193Ia 4500 | ||
|---|---|---|---|
| 001 | 13813 | ||
| 008 | 180118s9999||||xx |||||||||||||| ||eng|| | ||
| 020 | _a0471241393 | ||
| 040 |
_aTULIB _cTULIB |
||
| 041 | _aeng | ||
| 082 | _a621.38152 SCH | ||
| 100 | _aSchroder,Dieter | ||
| 245 | 0 |
_aSemiconductor material and device characterization / _cSchroder,Dieter. |
|
| 250 | _a2nd ed. | ||
| 260 |
_aNew York: _bJohn wiley, _c1998. |
||
| 300 | _axxiv,760p;26cm | ||
| 504 | _aIncludes bibliographical references. | ||
| 942 | _cBK | ||
| 999 |
_c9655 _d9655 |
||